3D Surface measurement
software for the scanning
electron microscope (SEM)

Electron Backscatter
Diffraction analysis systems
for materials characterisation

The LabX3500 for
production environments —
robust, reliable and easy
to use

The X-Supreme 8000
Benchtop XRF for rapid
results with little or
no sample preparation

The ultimate analysis
platform for SEM,
TEM and FIB

The innovative EDS
system specifically optimised
for advanced TEM
applications

Manipulate and fabricate
on a nano-scale using
Oxford Instruments
Omniprobe tools

Next generation silicon
drift detectors for
energy dispersive
analysis in SEM,
TEM and FIB